LS-161CS LS-1614C RoHS analyzer

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RoHS analyzer

1.Product introduction:

The new generation of design, is a unique sense of science and technology of one-machine multi-purpose spectrometer, using advanced EFP algorithm and low-light clustering technology with a new generation of multi-channel timely sequencing, specialized type not only retains the performance of the special thickness gauge to detect small samples and grooves, but also can meet the micro-area RoHS detection and full element analysis. Every function is the most professional.

2.Performance advantage

Micro sample detection Minimum measuring area 0.03mm² Zoom device algorithm The measuring distance can be changed to measure concave and convex shaped samples, and the zoom distance can reach 0-30mm Advanced EFP algorithm Li(3)-U(92) element coating, multiple layers of multiple elements, even the same element in different layers can be accurately measured Advanced spectrum resolution technology Reduce the interference of similar energy elements and reduce the detection limit High performance detector High performance SDD silicon drift detector with measurement accuracy up to nanometer level X-ray apparatus Microfocus enhanced ray tube with focusing device One machine multi-purpose, fine test fine test At the same time to meet the coating, RoHS, and alloy composition detection, and is the fine test, each use is professional grade

RoHS analyzer
3.Application field
entry

Model number

LS-161CSLS-1614C
Coating analysisIt can analyze 23 coatings and 24 kinds of elements at the same time, and it can also analyze and detect 90 kinds of elements of Li(3)-U(92) coating with the same elements in different layers
RoHS analysisThe minimum detection limit of harmful elements (RoHS, halogens) is 2ppmThe minimum detection limit of harmful elements (RoHS, halogens) is 1ppm
Component AnalysisS(16)-U(92)Al(13)-U(92)
EFP algorithmstandard
Software operationhumanized closed software, automatically judge fault prompt correction and operation steps to avoid misoperation
Analysis time3-200 seconds1-200 seconds
DetectorSi-Pin semiconductor detectorSDD Silicon drift detector
X-ray deviceMicrofocus enhanced ray tube
collimatorStandard: □0.1*0.3mm; Phi is 0.3 mm; Phi is 1.2 mm; φ3mm four collimator automatic switching

(Optional φ0.2mm; Phi is 0.5 mm; Phi is 1.2 mm; Phi is 3 mm)

 

Low light concentration technologyrecently measured the spot diffusion is less than 10%
FilterFour kinds of filter freely switch
Measuring distanceWith distance compensation function, can change the measuring distance of concave and convex shaped samples, zoom distance 0-30mm
Sample observation1/2.7 “color CCD, zoom function
Focusing modeHighly sensitive lens, manual focus
magnificationOptical 38-46X, digital amplification 40-200 times
Instrument size545mm*380mm*435mm
Sample chamber height210mm
Sample table moving modeHigh precision XY manual slide rail
Movable range50mm*50mm
weight of the instrument50kg
Other accessoriesA set of computer, printer, accessory box, 12-element sheet, RoHS standard sheet, electroplating solution measurement

Measuring cup (optional), standard plate (2 out of 10)

X-ray standardsDIN ISO3497, DIN 50987 and ASTMB568

RoHS detector

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