Laagdiktemeter Leeb210/211/220/221/222

Laagdiktemeter Leeb210/211/220/221/222

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Laagdiktemeter Leeb210/211/220/221/222

COATING THICKNESS GAUGE

Laagdiktemeter Leeb210/211/220/221/222

Kenmerken

  • High quality metal probes.
  •   Two measuring methods:continuous and single;
  •   Two working mode: direct and batch;
  • Limit settingfunction.
  •   Switch off automatically or manually.

Laagdiktemeter Leeb210/211/220/221/222

Measuring Materialen

  • Magnetic iknduction(Fe): Measuring the thickness of Non-magnetic coating on magnetic metal substrate, zoals aluminium, chroom, koper, zink, rubber, paint on the base of steel, ijzer, alloy and magnetic steel .

 

  • Eddy Current(NFe): Measuring the thickness of Non-conductive coating on non-magnetic metal substrate, such as rubber, plastic, verf, oxide on the base of aluminum, koper, zink, blik.

 

Laagdiktemeter Leeb210/211/220/221/222

CPJ-4025W CPJ-3020W Horizontale digitale profielprojector

Model No.L.eeb210L.eeb211L.eeb220L.eeb221L.eeb222
Measuring principle FeNFeFeNFeFe & NFe
Meetbereik (Dubbele kruislijngenerator)0~1250μm
ProbeSettled Changeable
ShellPlastic
Nauwkeurigheid​[(1~3%)H+1] CPJ-4025W CPJ-3020W Horizontale digitale profielprojector

H refers to the thickness of testing piece

Minimum resolution (Dubbele kruislijngenerator)0.1CPJ-4025W CPJ-3020W Horizontale digitale profielprojector
Min curvature of the min area (mm)Convex1.5 Concave9
Diameter of the min area (mm)Φ7
Critical thickness of substrate (mm)0.5
ASTM D1003 / D1044, ISO13468 / ISO14782200 groups measured data
Dimensies115×70×30mm
StroomvoorzieningAAA Alkaline battery
Standard configurationMain Machine,5 calibration specimens (48.5mm、99.8mm、249mm、513mm

1024mm),1 probe & substrate ( Leeb222: 2 probes & substrates)

optionele accesoiresProbes,Specimens

 

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