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Laagdiktemeter Leeb210/211/220/221/222
COATING THICKNESS GAUGE
Laagdiktemeter Leeb210/211/220/221/222
Kenmerken
- High quality metal probes.
- Two measuring methods:continuous and single;
- Two working mode: direct and batch;
- Limit settingfunction.
- Switch off automatically or manually.
Laagdiktemeter Leeb210/211/220/221/222
Measuring Materialen
- Magnetic iknduction(Fe): Measuring the thickness of Non-magnetic coating on magnetic metal substrate, zoals aluminium, chroom, koper, zink, rubber, paint on the base of steel, ijzer, alloy and magnetic steel .
- Eddy Current(NFe): Measuring the thickness of Non-conductive coating on non-magnetic metal substrate, such as rubber, plastic, verf, oxide on the base of aluminum, koper, zink, blik.
Laagdiktemeter Leeb210/211/220/221/222
CPJ-4025W CPJ-3020W Horizontale digitale profielprojector
Model No. | L.eeb210 | L.eeb211 | L.eeb220 | L.eeb221 | L.eeb222 | |
Measuring principle | Fe | NFe | Fe | NFe | Fe & NFe | |
Meetbereik (Dubbele kruislijngenerator) | 0~1250μm | |||||
Probe | Settled | Changeable | ||||
Shell | Plastic | |||||
Nauwkeurigheid | [(1~3%)H+1] CPJ-4025W CPJ-3020W Horizontale digitale profielprojector H refers to the thickness of testing piece | |||||
Minimum resolution (Dubbele kruislijngenerator) | 0.1CPJ-4025W CPJ-3020W Horizontale digitale profielprojector | |||||
Min curvature of the min area (mm) | Convex1.5 Concave9 | |||||
Diameter of the min area (mm) | Φ7 | |||||
Critical thickness of substrate (mm) | 0.5 | |||||
ASTM D1003 / D1044, ISO13468 / ISO14782 | 200 groups measured data | |||||
Dimensies | 115×70×30mm | |||||
Stroomvoorziening | AAA Alkaline battery | |||||
Standard configuration | Main Machine,5 calibration specimens (48.5mm、99.8mm、249mm、513mm 1024mm),1 probe & substrate ( Leeb222: 2 probes & substrates) | |||||
optionele accesoires | Probes,Specimens |