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Intruduction-3nh YS4510 color spectrophotometer
YS4510 standard spectrophotometer with 45/0 geometrical optics structure( 45 ring-shaped illumination ,vertical viewing), comply with C I E N o . 1 5. Adopting concave grating light splitting method. accurately measure the reflectivity and various chromaticity data of samples. users can customize the measurement aperture(ファイ 8 / ファイ 4 / ファイ 2 m m) according to the sample measuring demands, meet the industry accurate color measurement and quality control.
Product features-3nh YS4510 color spectrophotometer
1.Perfect combination of beautiful appearance and the human body mechanics structural design;
2.45/0 geometrical optics, conforms with CIE No.15,GB/T 3978,GB 2893,GB/T 18833,ISO7724/1,ASTM E1164,DIN5033 Teil7,GB 2893,GB/T 18833;
3.Use long life and low power consumption combined LED light source;
4.Optional aperture2mm/4mm/8mm, support both SCI and SCE at the same time;
5. Measure sample spectra, accurate Lab data , can be used in color matching and accurate color transmission;
6.High electronic hardware configuration: 3.5-inch TFT color LCD,Capacitive Touch Screen, concave grating, 256 Iimage Element Double Arrays CMOS Image Sensor;
7.USB port, widely useful;
8.Super stain-resistant and stable standard white calibration plate;
9.Large capacity storage space, over 20,000 measurement data;
10.Two standard observer angles, a variety of illuminant, a variety of color indexes, conforms with a variety of standard colorimetric data, meet a variety of customers’ demand for color measurement;
11.PC software has a powerful function extension.
12.Built – in multi – description of standard samples and specific traffic sign color gamut, especially suitable for traffic sign brightness factor and color performance.
モデル | YS4510 45/0 分光光度計 |
Illumination/Observation system | 45/0(45 ring-shaped illumination, vertical viewing); Comply with CIE No.15,GB/T 3978,GB 2893,GB/T 18833,ISO7724-1,ASTM E1164,DIN5033 Teil7,GB 2893,GB/T 18833 |
特徴 | Common spectrophotometer with customized one aperture, like 8mm aperture and apply in paints, inks, 織物, garments, printing and dyeing, printing etc industries for color transfer and quality control. |
Integrating Sphere Size | Φ48mm |
光源 | Combined LED Light |
Spectral separation device | Concave Grating |
検出器 | 256 Image Element Double Array CMOS Image Sensor |
波長範囲 | 400~700nm |
波長ピッチ | 10nm |
Half Bandwidth | 10nm |
反射率範囲 | 0~200% |
Measuring Aperture | Customized One Aperture:MAV:Φ8mm/Φ10mm;SAV:Φ4mm/Φ5mm;SAV:Φ2mm/Φ3mm; |
色空間 | CIE LAB,XYZ,Yxy,LCh,CIE LUV,HunterLAB,βxy |
色差式 | ΔE* ab,ΔE* uv,ΔE*94,ΔE*cmc(2:1),ΔE* cmc(1:1),ΔE*00,ΔE(猟師) |
Other Colorimetric Index | WI(ASTM E313,CIE/ISO,AATCC,猟師), YI(ASTM D1925,ASTM 313), MI (Metamerism Index), Staining Fastness, 色堅牢度, 色の濃さ, 不透明度, |
オブザーバー角度 | 2°/ 10° |
照らす | D65,A,NS,D50,D55,D75,F1,F2(CWF),F3,F4,F5,F6,F7(DLF),F8,F9,F10(TPL5),F11(TL84),F12(TL83/U30) |
Display Data | Spectrogram/Values, Chromaticity Values, Color Difference Values/Graph, Pass/Fail Result, Color Offset |
測定時間 | About 1.5s |
再現性 | Spectral reflectance: MAV,Standard deviation within 0.1% (400 nmから 700 nm: within 0.2%) 色度値:MAV,within ΔE*ab 0.05( 白色校正板を測定する場合 30 times at 5 second intervals after white calibration) |
Inter-instrument Error | Within ΔE*ab 0.2 (Average for 12 BCRA Series II color tiles) |
Measurement mode | Single Measurement, Average Measurement(2-99) |
サイズ(L * W * H) | 184*77*105んん |
重量 | About 600g |
電源 | Li-ion battery. 5000 measurements within 8 時間 |
Illuminant Life Span | 5 年, より多い 3 million times measurements |
画面 | 3.5-inch TFT color LCD, Capacitive Touch Screen |
インターフェース | USB |
Data memory | 標準 500 パック, サンプル 20000 パック |
言語 | 中国語,英語 |
Working Environment | 26℃未満をお勧めします: 0~40℃; Humidity: 0~85% (No Condensation);altitude: less than 2000 NS |
Storage Environment | 26℃未満をお勧めします: -20~50℃; Humidity: 0~85% (No Condensation) |
標準付属品 | Power Adapter, USBケーブル, Built-in li-ion battery, User Manual, software(download from the website)White and Black Calibration Board, Protective Cover. |
Optional Accessory | マイクロプリンター, Powder Test Box, Universal test components, Locating Plate |
ノート: The specifications are subject to change without notice. |