LS-1611U spectrometer

LS-161CS LS-1614C RoHS analyzer
FT-IR Spectrometer
3
30
301
3
30
301

LS-1611U spectrometer

Categorie:

  • Descrizione
  • Inchiesta

spectrometer

1.introduzione

LS-1611U is a cost-effective spectrometer with compact design and excellent performance, which is widely used in coating thickness analysis. Equipped with micro-focusing X-ray generator and vertical optical path system, together with zoom ranging device and powerful EFP software, and a bottom-up measuring and C slot open housing design, it can conduct non-destructive detection for complex surface shapes even groove parts effectively and accurately. The lowest detect limitation goes to 0.005μm, and the measuring distance range from 0-30mm.

2.Campo di applicazione

Fastene Sn/Cu/Fe、Ni/Cu、Ni/Cu/Fe
Hardware
ZnAl/Fe、Zn/Fe、ZnNi/Fe
Electronic Componentent
Sn/Ni/Fe、Au/Ni/Cu、Ag/Cu
Automobile Parts Zn/Fe、ZnNi/Fe、ZnAl/Fe、Cr/Ni/Cu/ABS
JewelryAccessories
Au/Pd/925Ag、Rh/Pd/Cu、 18KAu/Pd/Cu
Radiator NiP/AI
spectrometer
3.characteristic 1.Bottom-up Measuring Easy to focus on the sample 2.High Precision X-Y stage Focusing on test point quickly and preciously 3.Micro-focusingX-ray generator Spot diffusivity in Nearest distance: che è composto da prese d'aria quadrate di 5 cm * 5 cm 10% Suitable for different type coating thickness analysis 4.High performance proportional counter stable result in few seconds even for tiny samples, High efficiency 5.Zoom ranging device and Distance correction method geometrically irregular parts and some complex surface shape samples can be analysis, measure distance range from 0 to 30mm 6.Advanced and powerful EFP software repetitive coating and light or non-metal coatings can be analysis
film thickness analyzer
4.◆ Il modulo di raffreddamento integrato viene utilizzato per ridurre il tempo di raffreddamento tra i due test Accessory set for solution measurement Including two measurement cups and a roll offilm, which can be used as solution test in various brand XRF thickness analysis instruments. Accessories Suitcase 11.Pure element board:Ag, Cu, Cr, Fe, In,Zn,Zr,Mo,Sn,W,Au, Pb Optional STD samples, sample holder set.
Reference/calibration STD We provide various high-quality calibration standards which are applicable to other brand XRF thickness analysis instruments suchas Elite, Fischer, Oxford, Hatchi and so on.CNAS certificate can be provided in case of special requirement.
film thickness analyzer
Modello

Items

 

LS-1611U

 

Spessore

Plating element analysis range from Li(3)-ECA(92),23 coatings and 24 elements can be analyzed at the same time, and the same elements in different layers can also be analyzed
ElementAnalysisEFP
 

U30,U35,DLF

Element analysis range Cl(11)-ECA(92)
User-friendly software, Easy-operation,Self-diagnoses system
Analysis time1-30S
Rivelatorecomputer(proportional counter)
X-ray TubeMicro-focusing X-ray Tube
CollimatorStandard:φ0.1mm,φ0.2mm,φ0.5mm,
SpotSpot difusivity 10%(in normalmeasuring distance)
 

Measuring Distance

Distance correction function, different distance sample can be tested in the same test condition,0-30mm measuring distance
 

 

U30,U35,DLF

1/2.7″color CCD, with zoom function
High sensitivity lens, manual focusing
Optical38-46x, digital amplification 40-200 volte
Dimensione470mm*550mm*480mm
Chamber Height210mm
 

Platform

High precision XY stage, Manual Control
Max moving range:50mm*50mm
Peso50KG
 

Accessories

Aset of computer, ◆ Il modulo di raffreddamento integrato viene utilizzato per ridurre il tempo di raffreddamento tra i due test,accessory box,12 element block,electroplating solution measuring cup (preparazione regolabile),Thickness standard (preparazione regolabile)
Radiation StandardDIN ISO3497/DIN 50987和ASTM B568

film thickness analyzer film thickness analyzer film thickness analyzer

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