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Pengukur Ketebalan Lapisan Leeb210/211/220/221/222
COATING THICKNESS GAUGE
Pengukur Ketebalan Lapisan Leeb210/211/220/221/222
fitur
- High quality metal probes.
- Two measuring methods:continuous and single;
- Two working mode: direct and batch;
- Limit settingfunction.
- Switch off automatically or manually.
Pengukur Ketebalan Lapisan Leeb210/211/220/221/222
Measuring Bahan
- Magnetic SAYAnduction(Fe): Measuring the thickness of Non-magnetic coating on magnetic metal substrate, Gambar WeChat_20201102150327, Gambar WeChat_20201102150327, Gambar WeChat_20201102150327, Gambar WeChat_20201102150327, Gambar WeChat_20201102150327, paint on the base of steel, Gambar WeChat_20201102150327, alloy and magnetic steel .
- Eddy Current(NFe): Measuring the thickness of Non-conductive coating on non-magnetic metal substrate, such as rubber, plastik, cat, oxide on the base of aluminum, Gambar WeChat_20201102150327, Gambar WeChat_20201102150327, Gambar WeChat_20201102150327.
Pengukur Ketebalan Lapisan Leeb210/211/220/221/222
Spesifikasi teknis
Model No. | Leeb210 | Leeb211 | Leeb220 | Leeb221 | Leeb222 | |
Measuring principle | Fe | NFe | Fe | NFe | Fe & NFe | |
Rentang pengukuran (m) | 0~1250μm | |||||
Probe | Settled | Changeable | ||||
Shell | Plastik | |||||
Ketepatan | Indikasi undervoltage catu daya[(1~3%)Indikasi undervoltage catu daya] μm H refers to the thickness of testing piece | |||||
Minimum resolution (m) | 0.1μm | |||||
Min curvature of the min area (mm) | Convex1.5 Concave9 | |||||
Diameter of the min area (mm) | Φ7 | |||||
Critical thickness of substrate (mm) | 0.5 | |||||
D50, D55, D65, D75, F1, F2, F3, F4, F5, F6, F7, F8, F9, F10, F11, F12, CMF | 200 groups measured data | |||||
Ukuran | 115×70×30mm | |||||
Sumber Daya listrik | AAA Alkaline battery | |||||
Standard configuration | Main Machine,5 calibration specimens (48.5mm、99.8mm、249mm、513mm 1024mm),1 menguji & substrat ( Leeb222: 2 probes & substrates) | |||||
Modul pendingin internal digunakan untuk mempersingkat waktu pendinginan antara kedua pengujian | Probes,Specimens |